TESTING ARRANGEMENT AND TESTING METHOD

专利名称：TESTING ARRANGEMENT AND TESTING

METHOD

发明人：KAUKKO, PEKKA申请号：FI0100125申请日：20010212公开号：WO0159466A8公开日：20011011

摘要：The invention relates to a testing arrangement which comprises a connection (2)to be tested comprising one or more analogue components (11, 12). According to theinvention, to test one or more analogue components of the connection (2) the testingarrangement comprises a Boundary Scan-type digital component (21) which comprisesone or more contact elements (31 to 33), and through one or more contact elements, theBoundary Scan digital component (21) is connected to the connection (2) being tested sothat by means of an internal digital Boundary Scan control line (41) of the Boundary Scandigital component (21) and controlled by a controller (51) in the testing arrangement, avoltage-level control according to a digital logic value can be provided in at least onelocation to the connection (2) being tested comprising one or more analoguecomponents. The arrangement also comprises a measuring instrument (60) whichmeasures the connection (2) being tested comprising one or more analogue componentsand the Boundary Scan-type digital component connected to it, for the purpose ofmeasuring the impact of the voltage-level control directed to the connection beingtested. The arrangement further comprises a means (70) for analysing the measurementinformation of the measuring instrument (60), which determines a testing result

concerning one or more analogue components of the connection on the basis of themeasurement information of the measuring instrument (60).

申请人：ELEKTROBIT OY,KAUKKO, PEKKA

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