专利名称：On-chip resistor calibration apparatus and
method
发明人：Christopher Alan Menkus,Robert Callaghan
Taft
申请号：US11046576申请日：20050128公开号：US07332904B1公开日：20080219
专利附图：
摘要：An on-chip resistor is calibrated with a sense circuit that compares a resistanceassociated with an off-chip resistor to the on-chip resistor via a current-mirror circuit and
a comparator. A digital counter circuit evaluates the comparison and adjusts its countsuch that a variable digital control signal is provided to the on-chip resistor circuit. Duringthe calibration of the on-chip resistor circuit, the resistance of the on-chip resistor can bematched to the resistance of the off-chip resistor according to a scaling factor (e.g., 1×,2×, 2.5×, 10×, etc.) as may be desired. Once the resistance associated with the on-chipresistor circuit is sufficiently adjusted, another on-chip resistor (e.g., a terminating resistorof another circuit) can be adjusted from the counter value. Various other circuits can bedisabled during the calibration of the on-chip resistor such that additional sources oferror (e.g., supply variation, ground bounce, noise, etc.) are minimized.
申请人：Christopher Alan Menkus,Robert Callaghan Taft
地址：Munich DE,Munich DE
国籍：DE,DE
代理机构：Merchant & Gould PC
代理人：Brett A. Hertzberg
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